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Motic™ Panthera TEC Material Upright Trinocular Microscope
This Panthera TEC offers a high value for the inspection of semiconductors and various other materials, especially in industrial quality control and technical education. Brightfield, Darkfield and Cross-Polarization contrast are combined with a new, unique-to-Motic™ segmental illumination that all contribute to the versatility of this model.
Brand: Motic™ 1100104600221
This item is not returnable.
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Description
The Panthera TEC is clearly focused on material sciences, filling the last gap in the Panthera family. Brightfield, Darkfield and simple Polarization contrast combined with a new segmental illumination allows for an oblique incident illumination, perfect for detection of scratches or other defects on flat and reflecting surfaces without a need to move the sample.
- LD Plan BD objectives with a high imaging performance, mounted on 5-fold encoded nosepiece
- Light intensity for each objective position is automatically memorized and will be repeated once the objective is swung in again
- Compact Epi illuminator carries a slot for polarizer and analyzer, ready for Polarization contrast and reducing internal reflections
- Illuminator also includes controls for varying incident light in terms of mode (BF or DF) and illumination angle
- Extended Field of View offers 21% more visual area in comparison to basic 20 mm FOV system
- Beam split (25° viewing angle) is fixed by 50/50 (vis/photo)
- Incident illumination is performed by a 3W LED of selectable color temperature
- Incident/transmitted stand type for compound materials additionally carries transmitted LED illumination system with 39 LEDs mounted in an LED condenser (here, a stage with glass insert will be applied)
Specifications
| Trinocular | |
| BD/DF/RL | |
| 22 mm | |
| 152.4 x 101.6 mm (6 x 4 in.) |
| LED | |
| LD Plan BD | |
| 5-fold |